The AITT-AR analysis tool offers an easy user interface for performing frequency-domain, time-domain, or eye-diagram analysis. Its powerful plot tools allow a user to examine andcompare data.

For fixture removal applications, the AITT-SFD tool supports the 2X thru, 1X-reflect, and other traditional techniques for extracting network parameters required in modeling of high-speed interconnects, such as circuit board traces and vias, connectors, IC packages, and cables. It can automatically correct the impedance difference between the test fixture and DUT.

The AITT-PC tool assesses the causality and passivity of a S-parameter file and can enforce them for non-causal or non-passive cases.

The AITT-ME material extraction tool extracts DK, DF, and surface roughness of a printed-circuit board from S-Parameter measurements of traces on the PCB. Compared to conventional techniques, this approach is simpler and more accurate.

The AITT-DL solution guides a user to perform 1L measurements for high-volume manufacturing, 2L measurements for board-quality validation, and 3L measurements for material characterization, as recommended by the Intel Delta-L+ methodology.

See Datasheet AITT_DLP

AITT can be installed on a VNA locally or on a separate computer to control the VNA to perform measurements remotely.